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Influence of Oxygen Activity-Dependent Interfacial Non-Stoichiometry on Diffusion at Metal-Oxide Interfaces

机译:氧活依赖性界面非化学计量对金属氧化物界面扩散的影响

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Interfacial chemistry at (ternary) metal-oxide interfaces depends on the oxygen chemical potential. It changes within the coexistence range of metal and oxide, from interfacial oxygen excess at high oxygen chemical potential to local oxygen depletion at low oxygen chemical potential. Modifications of the local interfacial chemistry compared to bulk chemistry are stabilized by charge transfer across the interface between metal and oxide and give rise to the formation of a space charge layer in the oxide. This space charge layer is characterized by a relative depletion of positive charge carriers in case of oxygen excess and by a relative depletion of negative charge carriers in case of oxygen deficiency. As a consequence, diffusion along and across the interface strongly depend on the oxygen chemical potential and are expected to show anomalies related to the modified defect concentrations.
机译:(三元)金属氧化物界面的界面化学取决于氧气化学势。它在金属和氧化物的共存范围内变化,从高氧化学电位的界面氧过量到低氧化学潜力的局部氧耗尽。与批量化学相比,局部界面化学的修改通过电荷转移在金属和氧化物之间的界面上稳定,并导致氧化物中的空间电荷层的形成。该空间电荷层的特征在于,在氧气过量的情况下,在氧气过量的情况下对正电荷载体的相对耗竭耗尽,在缺氧情况下,负电荷载体的相对耗尽。因此,沿着界面的扩散强烈地取决于氧气化学潜力,并且预计将显示与改性缺陷浓度有关的异常。

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