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CHARACTERIZATION OF QUANTUM DOT STRUCTURES IN SEMICONDUCTOR MATERIALS

机译:半导体材料中量子点结构的表征

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Quantum dots (QD) have gained increasing interest in semiconductor physics as well as in optoelectronic device technology due to their special electrical and optical behavior. The generation of QDs has been attempted using different techniques. However, there was a breakthrough recently initiated by employing of self-ordering mechanisms during the epitaxial growth of lattice-mismatched semiconductor heterostructures, such as achieved in the Si/Ge and InGaAs systems ("Stranski-Krastanow" growth mode). Depending on the growth techniques applied (mainly MBE and MOCVD) the small islands differ in size, shape, chemical composition and lattice strain strongly influencing their optical behavior. The present paper mainly deals with the structural properties of such nanoclusters and their analysis by TEM techniques. Concerning the electrical and optical behavior of such quantum structures it is referred to review books, such as.
机译:由于其特殊的电气和光学行为,量子点(QD)对半导体物理学以及光电器件技术的兴趣增加了较高。使用不同的技术尝试生成QD。然而,最近通过使用在晶格错匹配半导体异质结构的外延生长期间的自排序机制来引发突破,例如在Si / Ge和IngaAs系统中实现(“stranski-krastanow”生长模式)。根据应用的增长技术(主要是MBE和MBE和MOCVD),小岛的尺寸不同,形状,化学成分和晶格应变强烈影响其光学行为。本文主要涉及这种纳米能器的结构性质及其通过TEM技术分析。关于这种量子结构的电气和光学行为,它被称为审查书籍,例如。

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