Sequential Variations of Fraunhofer Diffraction Pattern by Optical 4f Imaging System in As{sub}2S{sub}3 Thin Film

摘要

We observed sequential changes of Fraunhofer diffraction pattern due to photoinduced nonlinear refractive index changes in chalcogenide amorphous AS{sub}2S{sub}3 thin film by utilizing the optical 4f imaging system and also measured the power distribution of the temporal observed patterns.