首页> 外文会议>International Congress on Applications of Lasers Electro-Optics >Laser Metrology for In-situ Monitoring of Roughness for Diffusers for Light Emitting Devices and Laser Manufacturing
【24h】

Laser Metrology for In-situ Monitoring of Roughness for Diffusers for Light Emitting Devices and Laser Manufacturing

机译:用于原位监测发光器件和激光制造的扩散器的粗糙度的原位监测

获取原文

摘要

We present a novel, high incidence angle metrology for in-situ characterization of diffusers for light emitting device manufacturing. Metrology can be easily integrated on the side windows of the process chamber, and is insensitive to vibrations and stray light.
机译:我们提出了一种用于发光器件制造的漫射器的原位表征的新颖,高抗病角计量。计量可以容易地集成在处理室的侧窗上,并且对振动和杂散光不敏感。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号