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Modeling of FlowFET Characteristics

机译:Flumfet特征的建模

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摘要

Classical electrokinetic theory demonstrates that modulation of the ζ-potential at the shear plane can alter both the magnitude and direction of Electroosmotic Flow (EOF) induced in a microchannel at low driving field strengths. In the FlowFET, ζ-potential is modulated by applying a voltage V_G - with respect to the driving field cathode -through the insulated side walls of the device. An analytical model based on overall charge neutrality is. presented which predicts the ζ-potential as a function of V_G. This is compared to values of shear plane ζ-potential extracted from EOF rate measurement data in a FlowFET. It is found that the model data and experimentally derived values for ζ-potential are within the same order of magnitude with good agreement between modeled and experimentally observed trends. Discrepancies are due to uncertainties related to experimental observation and lack of Stern layer modeling.
机译:经典电动理论表明,剪切平面上的ζ电位的调制可以在低驱动场强度下改变微通道中的电渗流(EOF)的大小和方向。在流量的情况下,通过对驱动场阴极施加电压V_G - 通过装置的绝缘侧壁施加电压V_G来调制ζ电位。基于总电荷中立的分析模型是。呈现,其预测为v_g的函数。将其与从FlowFET中的EOF速率测量数据提取的剪切平面的值进行比较。发现模型数据和实验导出的ζ势值在相同的数量级内,在建模和实验观察到的趋势之间吻合良好。差异是由于与实验观察和缺乏船尾建模相关的不确定性。

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