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Characterization of superfine TiC powders by positron

机译:正电子粉末的特征

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By means of positron annihilation technique and high resolution electron microscope, superfine TiC powders obtained by ball-milling process were characterized at atomic scale. Results showed that there was a clear connection between a change in TiC powders and a change in the PAT parameters, and it was also confirmed by HREM results.
机译:通过正电子湮没技术和高分辨率电子显微镜,通过球磨过程获得的超细TiC粉末以原子刻度表征。结果表明,TIC粉末的变化与PAT参数的变化之间存在明显的连接,并通过HREM结果确认。

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