首页> 外文会议>International Conference on Die amp; Mould Technology; 20000726-28; Beijing(CN) >Characterization of Superfine TiC Powders by Positron Annihilation Technique and High Resolution Electron Microscope
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Characterization of Superfine TiC Powders by Positron Annihilation Technique and High Resolution Electron Microscope

机译:正电子ni没技术和高分辨率电子显微镜表征TiC超细粉末

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摘要

By means of positron annihilation technique and hign resolution electron microscope, superfine TiC powders obtained by ball-milling process were characterized at atomic scale. Results showed that there was a clear connection between a change in TiC powders and a change in the PAT parameters, and it was also confirmed by HREM results.
机译:借助正电子an没技术和高分辨电子显微镜,对通过球磨工艺制得的超细TiC粉末进行了原子级表征。结果表明,TiC粉末的变化与PAT参数的变化之间存在明确的联系,并且HREM结果也证实了这一点。

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