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Solid State Transfer Switches: The Quarter-Cycle Myth

机译:固态转印开关:四分之一周期神话

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The transfer to a load from a sagged to a healthy source is affected by a number of factors which appear to be common to all applications and, where thyristors are used in the solid state switch, are largely independent of the algorithms used to regulate the high speed transfer. Morover, the time required to actually execute the load transfer is virtually independent of the rapidity with which a power quality event is detected. The total transfer time is the combination of detection time, and the effect of physical processes relted to the solid state devices used in the high speed switch. These physical processes depend on distribution system topology and the interaction between the load and its medium voltage supply network. The paper looks at detection times in a simple, yet commonly used, algorithm and illustrates the system features which act to further delay the transfer process. Static switches complete the majority of their transfers within 1/4 of a cycle, but users need to understand the basic processes which can drive the transfer. The paper illustrates those processes, and emphasises the need for rigourous testing to validate quoted performance.
机译:从Sagged到健康来源的转移到负载受到许多因素的影响,这些因素似乎是所有应用程序,并且在固态开关中使用晶闸管,在很大程度上独立于用于调节高的算法速度转移。 Morover,实际执行负载传输所需的时间几乎与检测到电力质量事件的快速度无关。总转移时间是检测时间的组合,并且物理处理的效果与高速开关中使用的固态设备相关的。这些物理过程取决于分配系统拓扑和负载与其中压供电网络之间的相互作用。本文在简单但常用的算法中查看检测时间,并说明了用于进一步延迟传输过程的系统特征。静态开关在一个周期的1/4内完成了大部分转移,但用户需要了解可以推动传输的基本进程。本文说明了这些过程,并强调了对验证引用性能的严格测试的需求。

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