The effect of thallium distribution on luminescence of CsI:Tl

摘要

Luminescence spectra and decays of CsI-Tl evaporated thin layers of "pillar-like" structure with different distributions of activator were studied under UV-VUV and X-ray excitation. The influence of thallium distribution on luminescence is discussed in comparison with CsI-Tl single crystal. Luminescence excitation spectra in the VUV region from 4 to 40 eV of thin layers demonstrated a transfer process very similar to those observed in single crystal. The possibility of using the synchrotron radiation micrometer size X-ray beam for microluminescence study of CsI-Tl thin layers was tested in MICRPROBE station of DCI storage ring of LURE.