首页> 外文会议>Symposium on atomic force microscopy/scanning tunneling microscopy >The study of sublimation rates and nucleation and growth of tnt and petn on silica and graphite surfaces by optical and atomic force microscopy and ellipsometry
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The study of sublimation rates and nucleation and growth of tnt and petn on silica and graphite surfaces by optical and atomic force microscopy and ellipsometry

机译:光学和原子力显微镜和椭圆形测定升华率和TNT和PETN核切割和生长的研究

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Optical and atomic force microscopy (AFM) were used to study the structure and crystallization kinetics of 2,4,6-trinitrotoluene (TNT) and pentaerythritol tetranitrate (PETN) vapor deposited on silica, Muscovite mica and highly oriented pyrolytic graphite (HOPG) surfaces. Under ambient conditions, the deposited TNT and PETN on these surfaces are in supercooled liquid droplet forms. Dendritic-like crystal nucleation and growth are found for both TNT and PETN on a silica surface after the exposure to the air for 16 and 48 h, respectively. A plate-like solid TNT is also observed int he depletion zone between the grown crystals and the supercooled liquid droplet region. Both AFM and DSC measurements suggest that thest plate-like TNT films are amorphous.
机译:光学和原子力显微镜(AFM)用于研究2,4,6-三硝基甲苯甲丁橡胶(TNT)和季戊四醇四硝酸四硝酸盐(PETN)气相的结构和结晶动力学,沉积在二氧化硅,Muscocite云母和高度取向的热解石墨(HOPG)表面上。在环境条件下,这些表面上的沉积的TNT和佩特是过冷液滴形式。在暴露于空气16和48小时后,在二氧化硅表面上发现树突状晶体成核和生长。在生长的晶体和过冷液滴区域之间也观察到板状固体TNT。 AFM和DSC测量均表明,基板类似的TNT薄膜是无定形的。

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