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JOHN BARDEEN AND TRANSISTOR PHYSICS

机译:John Bardeen和晶体管物理学

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摘要

The recent 50th anniversary of the invention of the point-contact transistor and the discovery of transistor action by Bardeen and Brattain in December, 1947, the first solid-state electronic device to utilize both free-electrons and free-holes, has received considerable attention. The assessment as to whether the minority-carrier holes emitted into the large grained polycrystalline, n-type germanium (or silicon) sample were mainly transported from the emitter to the collector through the p-type inversion layer or exhibited some non-trivial transport as minority carriers through the ?type bulk sample, continues to be of interest. A model calculation is presented that suggests one might anticipate some fraction of bulk minority-carrier transport, concurrent with transport in the inversion layer. In that regard, Shive's experiment clearly illustrated the importance of the geometrical configuration in determining the extent of bulk transport while Shockley's seminal contribution of injection over a barrier, p-n junction theory and p-n junction transistor facilitated the mathematical description of Bardeen and Brattain's previously disclosed transistor action by using a one-dimensional analysis. Bardeen also comprehended that it was not efficient to modulate the conductivity of a slab of semiconductor via the field effect and, thereby, patented the first modern transistor device. This was an insulating gate modulating an n-type inversion layer via the field effect, utilizing the inversion layer to confine the minority-carrier transport, in series with a reverse-biased n-p junction, and resulted in the first recorded power gain in a solid-state amplifier. The device, described by Sah as a sourceless MOS transistor, became the basis of, for example, subsequent MOS memory DRAM and CMOS microprocessor applications. Indeed, John Bardeen, the co-inventor of the point-contact transistor and inventor of the MOS transistor, may rightly be called the father of modern electronics.
机译:本发明的第50周年十六天,1947年12月12日由Bardeen和Brattain发现晶体管动作,第一个固态电子设备用于利用自由电子和自由孔,已经接受了相当大的关注。评估作为对少数载流子的孔是否发射到大晶粒的多晶,n型锗(或硅)样品主要从发射器传送到通过P型颠倒层的集或显示出一些非平凡的运输为少数民族载体通过?型散装样本,仍然是感兴趣的。提出了一种模型计算,表明人们可能预测一部分散装少数载波运输,并在反转层中运输并发。在这方面,Shive的实验清楚地说明了几何配置在确定散装运输程度时的重要性,而Shockley对屏障注射的开场贡献,PN结理论和PN结晶体管有助于Bardeen和Brattain先前公开的晶体管动作的数学描述通过使用一维分析。 Bardeen也理解,通过现场效应调制半导体板的电导率并不有效,并且由此获得专利的第一现代晶体管装置。这是一种通过场效应调节N型反转层的绝缘栅极,利用反转层将少数载波传输限制在与反向偏置的NP结串联,并导致第一记录的功率增益 - 站式放大器。由SAH作为源券MOS晶体管描述的装置成为例如随后的MOS存储器DAM和CMOS微处理器应用的基础。实际上,John Bardeen是MOS晶体管的点接触晶体管和发明者的共同发明人,可以正确地称为现代电子的父亲。

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