首页> 外文会议>International symposium on instrumentation science and technology >Advancements in the Interferometric Measurements of Real Time Finishing Birefringent Filter's Crystal Plates
【24h】

Advancements in the Interferometric Measurements of Real Time Finishing Birefringent Filter's Crystal Plates

机译:实时整理双折射滤波器的水晶板的干涉测量的进步

获取原文

摘要

The finishing of birefringent plates consists of two processes: polishing and evaluation of a surface, which have been performed separately till now. The purpose of this work is achieving of high accuracy of the evaluation and machining of the plane-parallel plates from birefringent crystals, in particular of crystal plates of birefringent filters during their finish-ing.The developed process combines evaluation and polishing in an interactive way. We have found modes of treatment, shape of polisher, have designed interferometer, with a mirror arranged in polisher. Visual checking of optical thickness comparatively with reference plate was carried out using the interference fringes of equal birefringence, and checking of an optical wedge-by interference rings of an equal inclination. The automated processing of TV camera interference fringes was impossible, because of gaps of interference fringes on polishing cells above the mirror. Therefore a special software was developed for processing of a complex fringe pattern interferogram. Software Fastlnterf uses furrier analysis technique which allows to process an interferogram with multiply gaps. Interferograms are registered by a high resolution TV camera (1280×1024). Automatic processing of a fringe interferogram using Fastlnterf software takes less then one second. The influence of gaps is excluded, and the flat field is taken into account. Software provides full 3D surface and wavefront maps. Aberration analysis of a wavefront gives information on thickness of a plate comparatively with a reference one, optical wedge of plate and azimuth of an inclination of wave front. Moreover, software provides a control of surface quality. The measuring device, features of the software are described and process of interferometric evaluation during polishing is illustrated.
机译:双折射板的精加工由两种方法组成:抛光和评估表面,其直到现在。本作作品的目的正在实现从双折射晶体的平面平行板的评价和加工的高精度,特别是在其完成期间双折射过滤器的晶体板。开发过程结合了互动方式的评估和抛光。我们发现了处理方式,抛光机的形状,设计了干涉仪,镜子在抛光机中排列。使用相同的双折射的干涉条纹和通过相同倾斜的间干圈检查光学厚度的视觉检查光学厚度。电视摄像机干涉条纹的自动化处理是不可能的,因为在镜子上方的抛光单元上的干涉条纹的间隙。因此,开发了一种特殊的软件,用于处理复杂的条纹图案干涉图。软件FastLnterf使用Furrier分析技术,该技术允许处理具有乘法间隙的干扰图。干涉图是由高分辨率电视摄像头注册(1280×1024)。使用FastLnterf软件自动处理FastLnterf软件的边缘干涉图少一秒钟。排除了间隙的影响,将扁平字段考虑在内。软件提供完整的3D表面和波前映射。波前的像差分析可以对板的厚度提供关于板的厚度的信息,相对参考一个,光学楔的板和方位角的波正面的倾斜度。此外,软件提供了对表面质量的控制。描述了测量装置,软件的特征和抛光期间的干涉测量过程。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号