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A study of a new flip chip packaging process for diversified bump and land combination

机译:一种新的多元化凸起和陆地​​组合的倒装芯片包装工艺的研究

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Flip chip packages using plastic substrates are becoming popular in the IC packaging market. However, it still has not been standardized as a real mass production system. We have newly developed a flip chip packaging technology using a nonconductive underfill resin sheet. The process flow of the new flip chip packaging is as follows. First, the underfill sheet is laminated onto substrate. Next, the bumped die is aligned and attached onto substrate which is covered by the underfill sheet under proper heat and pressure. The bumps under the die penetrate the resin and to reach the metal land of the substrate. Finally curing the underfill sheet and metal connection are carried out. We have studied the possibility of applying this packaging technology to a diversified bump and land combination by changing the underfill component and process parameters. The electrical stability and package warpage under several stress test conditions, such as JEDEC Level-3 and TST, have been evaluated in this study. After this evaluation, we found that the packages which have been built with proper resin components and process parameters show good performance for all of these reliability tests almost regardless of bump and land materials.
机译:使用塑料基材的倒装芯片封装在IC包装市场中变得流行。但是,它仍然没有被标准化为真正的批量生产系统。我们使用非导电底部填充树脂片新开发了倒装芯片封装技术。新的倒装芯片包装的过程流程如下。首先,将底部填充片层叠在基材上。接下来,凸块模具被对准并附着在基板上,基板被底部填充片覆盖在适当的热量和压力下。模具下的凸块穿透树脂并到达基材的金属焊盘。最后固化底部填充板和金属连接。我们研究了通过改变底部填充部件和工艺参数将该包装技术应用于多样化的凸起和陆地​​组合的可能性。在该研究中,在若干压力测试条件下的电气稳定性和包装翘曲已经在本研究中进行了评估。在此评估之后,我们发现用适当的树脂组件和工艺参数构建的封装对于所有这些可靠性测试,几乎无论凹凸和土地材料如何,都会表现出良好的性能。

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