Using the infrared magnetorefractive effect to compare the magnetoresistance in (100) and (111) oriented Fe_3O_4 films

摘要

The infrared magnetorefractive effect (MRE) is used to compare the magnetoresistance (MR) in epitaxial thin films of Fe_3O_4 grown on MgO with (100) and (111) crystal orientations. The smaller MRE detected in the (111) film is shown to correlate with the smaller electrically measured MR, its behavior consistent with a lower density of antiphase boundaries in the (111) film