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Investigation of Atomic Structure Ahead of Crack Tip by STM and AFM

机译:STM和AFM裂缝提前原子结构调查

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Studies of surface cracks were conducted to understnad the nanostructure and atomic structure ahead of surface crack tip with or without applied loading, using Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). For unloaded crack tips on the (0001) surface of highly oriented pyrolytic graphite there are many small voids or vacancy clusters ahead of the crack tips, which may migrate and merge into the cracks. For loaded crack tips on the (0001) surface of mica samples, there exists a severely distorted zone ahead of the loaded crack tips, in which the arrange of atoms is in disorder, and there are many vacancies and vacancy clusters. Around the distorted zone there exists an abnormal elastic region, in which the atoms can be detected.
机译:使用扫描隧道显微镜(STM)和原子力显微镜(AFM),进行了表面裂缝的研究以静止,以静止,在表面裂纹尖端的表面裂纹尖端前方的表面裂纹尖端和原子结构。对于(0001)表面上的卸载裂缝尖端,高度导向的热解石墨,在裂缝尖端之前有许多小空隙或空位簇,这可能会迁移并合并到裂缝中。对于在云母样本的(0001)表面上的装载裂纹尖端,在装载的裂纹尖端前面存在严重扭曲的区域,其中原子的排列处于紊乱,并且存在许多空缺和空缺簇。在扭曲的区域周围存在异常的弹性区域,其中可以检测原子。

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