AN ACTUATING STRUCTURE FOR RAMAN-ATOMIC FORCE MICROSCOPE(AFM) AND A METHOD FOR CONTROLLING THE ACTUATING STRUCTURE

摘要

A driving structure for a Raman-atomic force microscope according to an embodiment includes a sample substrate on which a sample is placed, and a platform disposed under the sample substrate to control a position of the sample substrate, and the platform is the sample The position of the substrate can be controlled in units of micrometers or nanometers.