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Doping experiments on YBa_2Cu_3_(7-x) ultrathin films by using electric fields

机译:使用电场掺杂在YBA_2CU_3_(7-X)超薄膜上的实验

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The hole concentration of YBa_Cu_3O_(7-x) ultrathin films was changed by electric fields using superconducting field effect transistors. The transistors were composed of YBa_2Cu_3O_(7-x)/SrTiO_3/Au trilayers prepared in situ by pulsed laser deposition on (100) SrTiO_3 substrates and patterned by appropriate metal masks during the deposition process. The hole concentration change was determined by measuring the field-induced dielectric polarization of the SrTiO_3 dielectric. The modulations of the resistance RDS, the superconducting transition temperature T_c and the critical current density j_c were investigated as a function of the relative change of the hole concentration n. The relationships were found to be linear with slopes of a-1, 0 = 2.5 and y = 3 for the modulations of R_(DS), T_c, and j_c, respectively. A hole concentration of n = 1 * 10~(21) cm~3 could be determined. The possible influence of weak links on the results is considered in the discussion.
机译:使用超导场效应晶体管通过电场改变YBA_Cu_3O_(7-X)超薄膜的空穴浓度。晶体管由在(100)SRTIO_3基板上通过脉冲激光沉积原位制备的YBA_2CU_3O_(7-X)/ SRTIO_3 / AU三层组成,并在沉积过程中通过适当的金属掩模图案。通过测量SRTIO_3电介质的场诱导的介电偏振来确定空穴浓度变化。作为空穴浓度N的相对变化的函数,研究了电阻RDS,超导转变温度T_C和临界电流密度J_C的调节。发现该关系与A-1,0 = 2.5和Y = 3的斜率分别是用于R_(DS),T_C和J_C的斜率的线性。可以确定n = 1×10〜(21)cm〜3的空穴浓度。在讨论中考虑了弱链路对结果的可能影响。

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