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Structural and Superconducting Properties of MBE Grown Bi_2Sr_2CuO_(6+δ) Thin Films

机译:MBE生长BI_2SR_2CUO_(6 +δ)薄膜的结构和超导特性

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Epitaxial Bi_2Sr_2CuO_(6+δ) thin films have been obtained by Molecular Beam Epitaxy (MBE) using a coevaporation method. Transport measurements show that the slope of the resistance as a function of the temperature strongly depends upon the sto-ichiometry of the samples. Reflection High Energy Electron Diffraction (RHEED) patterns show the presence of a superstructure along the b direction due to an excess of oxygen. Moreover, RHEED figures related to a - b twinning, as often seen also for Bi_2Sr_2Ca_1Cu_2O_(8+x), have been observed. The c-axis length, obtained by X-ray diffraction patterns, has been studied as a function of the sample stoichiometry.
机译:外延Bi_2SR_2Cuo_(6 +δ)薄膜已经通过分子束外延(MBE)获得使用COEVAPION方法获得。运输测量表明,由于温度的函数的电阻斜率强烈取决于样品的STO-I化学计量。反射高能量电子衍射(RHEEED)图案显示由于过量的氧气引起的沿B方向的上部结构的存在。此外,已经观察到与A - B孪晶相关的RHEEED图,经常被观察到Bi_2SR_2CA_1CU_2O_(8 + X)。通过X射线衍射图案获得的C轴长度作为样品化学计量的函数研究。

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