Study of Ramp-Type Josephson Junctions by HREM

摘要

Structural aspects of ramp-type Josephson junctions based on REBa_2Cu_3O_(7-δ) high-T_c superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa_2Cu_(3-x)Ga_xO_(7-δ).The ramp-geometry depends on the etching conditions. High levels of Ga doping (x > 0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.