Micromechanical characterization of silicate- class/sapphire interfaces using nanoindentation and microscratch methods

摘要

The mechanical behavior of the interfacesbetween calcium aluminosilicate (CAS) glasses and sapphiresubstrates was examined. The interfaces were prepared bydepositing continuous films of CAS on two differentcrystallographic orientations of single-crystal #alpha#-Al_2O_3by means of Pulsed-Laser Deposition (PLD). The specimenswere tested using two high-resolution depth-sensing indentationinstruments. Various nanoindentation and microscratchtechniques were employed. The main emphasis has been placedon examining how the properties of the alumina/silicate-glassinterface depend on the substrate crystallographic orientation.The mechanical data obtained from these experiments weredirectly correlated with the morphology of the deformed regionsexamined with scanning electron microscopy (SEM) and atomicforce microscopy (AFM).