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Power Absorption by Dielectric Contaminants in High Power Microwave Systems

机译:高功率微波系统中介电污染物的功率吸收

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The heating of dielectric microwave transmission windows places an effective upper limit on the amount of power that may be transmitted through the window. Lossy surface films are known to form on diamond gyrotron windows, while thin films of TiN are intentionally deposited on alumina klystron windows to protect against multipactor. A uniform thin film of contaminant on a microwave window may absorb up to 50% of the incident power, even if the film thickness is only a small fraction of its resistive skin depth. Typical values for power losses due to surface films are on the order of 0.1%. This paper also provides the most general theoretical treatment to date on the degree of Ohmic heating of discrete particulates by the rf electric field and the rf magnetic field of an electromagnetic wave, with the only assumption being that the wavelength is large in comparison with the particulate size. In general, heating by the rf magnetic field is dominant whenever the resistive skin depth is less than the radius of the particulate. The analysis may form a theoretical basis in the heating phenomenology of particulates.
机译:电介质微波透射窗的加热位于可以通过窗口传输的功率量的有效上限。已知有损表面薄膜在金刚石陀螺窗口上形成,而有意沉积在氧化铝Klystron窗口上的薄膜以防止多移能势。即使薄膜厚度仅为其电阻性皮肤深度的一小部分,微波窗口污染物的均匀薄膜也可能吸收到入射功率的50%。由于表面膜引起的功率损耗的典型值约为0.1%。本文还提供了迄今为止通过RF电场和电磁波的RF磁场的离散颗粒的欧姆加热程度的最普遍的理论处理,唯一的假设与颗粒相比,波长很大尺寸。通常,每当电阻性皮肤深度小于颗粒的半径时,通过RF磁场的加热是显性的。分析可以在颗粒的加热现象学中形成理论基础。

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