Optoelectronic Developments in Speckle Interferometry

摘要

Speckle interferometry is now being used extensively in a range of engineering metrology applications. This paper reviews how developments in optoelectronic technology, such as solid state laser sources and optical fibre, have led to advances in the measurement capability of speckle interferometer systems. Examples are presented of surface profile, surface slope, static displacement and displacement gradient, and vibration measurement including heterodyning and stroboscopic techniques.