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Device for measuring an object by means of speckle interferometry and associated method

机译:通过散斑干涉测量法测量物体的装置及相关方法

摘要

Device (1) for measuring an object (2) by means of speckle interferometry, comprising a primary light source (3), a beam splitter (7), the light of the primary light source (3) in an object beam path (4), in which the object (2 ) and a reference beam path (5) and an imaging device (8) imaging optical device, wherein the primary light source (3) emits light, which leads to an incoherent intensity average on the detection device (8) or that the primary light source (3) an averaging device (10, 19) is arranged downstream, which is designed to generate light from the coherent light emitted by the primary light source (3), which leads to incoherent intensity averaging on the detection device (8).
机译:通过散斑干涉测量法测量物体(2)的设备(1),包括一个主光源(3),一个分束器(7),在物体光束路径(4)中的主光源(3)的光),其中物体(2)和参考光束路径(5)以及成像设备(8)成像光学设备,其中主光源(3)发出光,导致检测设备上的平均强度不相干(8)或在主光源(3)的下游设置一个平均装置(10、19),该装置被设计为从由主光源(3)发出的相干光中产生光,从而导致非相干强度平均在检测设备(8)上。

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