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An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays

机译:考虑门延迟效应的多种侵略者串扰故障的基于ILP的ATPG技术

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Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.
机译:串扰故障已成为电路故障的重要机制。长信号网特别关注,因为它们倾向于对整体电容比具有更高的耦合电容。典型的长网也有多个侵略者。在生成模式时,在网络上创建最大串扰噪声,可能无法逻辑地或同时激活所有攻击者。因此,模式生成必须侧重于激活侵略性的最大侵略性子集或在受害者Net交换机上的相同时间,同时将故障效应传播到主要输出。这是一个众所周知的问题。在本文中,我们提出了一种解决方案,该解决方案与电路变换结合使用0-1整数线性编程(ILP)以模拟门延迟。本文的主要贡献是将多路故障传播建模作为线性编程问题。该提出的技术应用于ISCAS 85基准电路。结果表明,可以切换的总电容百分比从20-80%变化。由该技术产生的图案对于制造测试应用以及信号完整性验证是有用的。

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