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Eliminating parasitic resistances in parameter extraction of semiconductor device models

机译:消除半导体器件型号参数提取中的寄生电阻

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A network theorem based on potential functions is used for the purpose of cancelling the detrimental effect that the presence of parasitic linear elements has on procedures used for extracting the intrinsic-model parameters of semiconductor devices. The method is based on the use of an auxiliary function: the difference between the content and the co-content functions of the device. The theorem states that, for any arbitrarily connected network of linear and nonlinear branch elements, the summation of the difference functions of each of the branches is zero, and that this difference function is zero at any branch represented by a linear I-V characteristic. In establishing this theorem we also show that: (a) the summation of the contents, over all the branches, is zero; and (b) the summation of the co-contents, over all the branches, is zero. To illustrate the procedure the intrinsic model parameters of a real p-n junction are extracted using this idea.
机译:基于潜在功能的网络定理用于取消寄生线性元件的存在对用于提取半导体器件的内在模型参数的过程的不利影响。该方法基于使用辅助功能:内容与设备的共内容函数之间的差异。定理指出,对于任何任意连接的线性和非线性分支元件网络,每个分支的差函数的求和为零,并且该差函数在线性I-V特征表示的任何分支处为零。在建立本定理时,我们还表明:(a)内容的总和,在所有分支上,为零; (b)在所有分支机构中,共含量的总和为零。为了说明程序,使用此想法提取真实P-N结的内在模型参数。

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