Connection of the parametric and functional control for TID testing of complex VLSI circuits

机译：复合VLSI电路TID测试的参数和功能控制的连接

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摘要

The article describes an original technique for TID testing of complex VLSI circuits (microprocessors) based on combined use of parametric and functional control. The resulting dependences obtained in radiation experiment are qualitatively confirmed by circuit simulation.

机译：本文介绍了基于参数和功能控制的组合使用的复杂VLSI电路（微处理器）进行TID测试的原创技术。在辐射实验中获得的所得到的依赖性通过电路模拟定性证实。

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来源
《European Conference on Radiation and its Effects on Components and Systems》|2015年||共4页
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作者
Vladimir A. Marfin; Pavel V. Nekrasov; Ilya O. Loskutov;
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原文格式 PDF
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中图分类 TN014-53;
关键词
Parametric control; Functional control; Microprocessors; The minimum supply voltage;

机译：参数控制;功能控制;微处理器;最小电源电压;

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专利

1. Instrumentation: Automated board testing: Coping with complex circuits: As printed circuit boards become harder to test due to VLSI components, automated systems and new design techniques are coming to the rescue [J] . Tulloss R.E. IEEE Spectrum . 1983,第7期

机译：仪器仪表：自动化的电路板测试：应对复杂的电路：由于VLSI组件使印刷电路板的测试变得更加困难，因此自动化系统和新的设计技术应运而生
2. Dynamic functional testing for VLSI circuits [J] . Maurer P.M. IEEE Design & Test of Computers Magazine . 1990,第6期

机译：VLSI电路的动态功能测试
3. Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX [J] . Aleksey Egorov*, Pavel Nekrasov, Oleg Kalashnikov MATEC Web of Conferences . 2016,第2016期

机译：用于ARM微控制器STM32F1XX的功能和参数测试的软硬件复合体
4. Connection of the parametric and functional control for TID testing of complex VLSI circuits [C] . Vladimir A. Marfin, Pavel V. Nekrasov, Ilya O. Loskutov European Conference on Radiation and its Effects on Components and Systems . 2015

机译：复合VLSI电路TID测试的参数和功能控制的连接
5. Low cost power and supply noise estimation and control in scan testing of VLSI circuits [D] . Jiang, Zhongwei 2010

机译：VLSI电路扫描测试中的低成本电源和电源噪声估计与控制
6. Complex organized atrial arrhythmia with alternation between two circuits involving probable epicardial connections: An ultra-high-density mapping study [O] . Ghassan Moubarak, Alexandre Zhao, Olivier Thomas, 2019

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7. Functional Lower Bounds for Arithmetic Circuits and Connections to Boolean Circuit Complexity [O] . Forbes Michael A., Kumar Mrinal, Saptharishi Ramprasad 2016

机译：算术电路的功能下界和布尔电路复杂度的连接
8. Bulk CMOS VLSI Technology Studies. Part 5. The Design and Implementation of a High Speed Integrated Circuit Functional Tester [R] . Trotter, J. D., Robbins, H. D. 1985

机译：批量CmOs VLsI技术研究。第5部分：高速集成电路功能测试仪的设计与实现

Connection of the parametric and functional control for TID testing of complex VLSI circuits

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