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Response time of photoemission of thin film with different surface potential barriers

机译:不同表面潜在屏障的薄膜光电响应时间

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The response time of photoemissive materials is required for detecting ultrashort duration laser pulses. The photoelectron's response time will increase with increasing energy of photons. If the surface potential barrier of thin film declines, the photoemissive sensitivity or quantum yield will rise, however the response time will also increase which means that response time characteristic gets worse. As an example, the response time for Ag-O-Ca thin film is calculated.
机译:检测超短持续时间激光脉冲所需的响应时间是检测超短持续时间的响应时间。通过增加光子的能量,光电子的响应时间将增加。如果薄膜的表面电位屏障下降,光明性敏感性或量子产量将上升,但响应时间也会增加,这意味着响应时间特征变得更糟。作为示例,计算AG-O-CA薄膜的响应时间。

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