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Influence of migration on the electrical properties of HV extruded cables

机译:迁移对高压挤出电缆电性能的影响

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Radial distribution of the electrical characteristics of HV XLPE insulated cables was investigated with respect to EEA or EBA oligomers migration into the insulation. During processing and aging, the migration of low molecular weight fractions of EEA or EBA copolymers used in semiconductive compounds gives rise to an increase of tan delta close to the semiconductive shields, and to a decrease of AC and DC breakdown strengths. However, this migration seems to increase the impulse breakdown strength, and to avoid bow-tie trees development.
机译:研究了HV XLPE绝缘电缆的电气特性的径向分布,研究了EEA或EBA低聚物迁移到绝缘体中。在加工和老化期间,半导体化合物中使用的EEA或EBA共聚物的低分子量分数的迁移产生了靠近半导电屏蔽的Tan Delta的增加,并且减少了AC和DC击穿强度。然而,这种迁移似乎增加了脉冲击穿力量,并避免了弓形树的发展。

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