An approach to the analysis of the current testability of IC analog sections

摘要

Integrated circuits considering mixed analog and digital section parts are becoming a strategic target of the microelectronic design methodologies. Focussing our attention on the testing aspect and knowing the interest and efficiency of current testing in digital circuits the possibility to extend this technique to analog parts is analyzed in this work. An analysis of the behavior of typical analog blocks under exhaustive set of open and bridging defects shows the interest to consider quiescent power supply current as an additional observable for analog testing. A new sensor is presented and analyzed showing interesting self-testable features, the sensor (built-in sensor) is applied to an operational amplifier. The strategy is applied later to a mixed signal A/D flash converter where current testing is used for both digital and analog parts. The work presents for all the points considered results of experimentation from implemented ICs.