A novel scheme for built-in self-testing used in current testing environment (named BICST) is presented in this paper. Test vectors are generated on chip in BICST to detect the stuck-on and bridging faults as well as stuck-at faults in a CMOS circuit. The test set generated by pseudo-exhaustive testing method can detect stuck-on and bridging faults that cause abnormal large current flow in the circuit, which will be caught by the built-in current sensors. Partitioning is done for pseudo-exhaustive testing and to obtain high resolution in current measuring. The overall structure of the BICST system is also presented.
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