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Minimum Resolvable Temperature Difference Measurements on Undersampled Imagers

机译:欠采样成像仪上的最小可分辨温差测量

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Minimum Resolvable Temperature Difference (MRTD or just MRT) is the primary measurement of performance for infrared imaging systems. Where Modulation Transfer Function (MTF) is a measurement of resolution and three-dimensional noise (or noise equivalent temperature difference) is a measurement of sensitivity, MRTD combines both measurements into a test of observer visual acuity through the imager. MRTD has been incorrectly applied to undersampled thermal imagers as a means for assessing the overall performance of the imager. The incorrect application of the MRTD (or just MRT) test to undersampled imagers includes testing to the half-sample (or Nyquist rate) of the sensor and calling the MRT unresolvable beyond this frequency. This approach is known to give poor predictions in overall system performance. Also, measurements at frequencies below the half-sample rate are strongly dependent on the phase between the sampling geometry and the four-bar target. The result is that very little information in the MRT measurement of an undersampled thermal imager is useful. There are a number of alternatives including Dynamic MRT (DMRT), Minimum Temperature Difference Perceived (MTDP), Triangle Orientation Discrimination (TOD), and objective MRT tests. The NVESD approach is to measure the MTF and system noise and to use these measurements in the MRT calculation to give good sensor performance predictions. This paper describes the problems with MRT for undersampled imagers, describes the alternative measurements, and presents the NVESD approach to MRT measurements.
机译:最小可分辨温差(MRTD或只是MRT)是用于红外成像系统性能的主要测量。其中调制传递函数(MTF)是分辨率和三维噪声(或噪声等效温差)的测量值是灵敏度的测量,MRTD结合了测量到通过所述成像器观察者的视力测试。 MRTD已被错误地施加到欠热成像作为评估成像器的整体性能的装置。的MRTD(或只是MRT)测试,以欠成像器的不正确应用程序包括测试到半样品(或奈奎斯特速率)的传感器的并调用MRT无法解决的超出该频率。这种方法被称为给整个系统性能不佳的预测。另外,在半采样率以下的频率测量是强烈地依赖于采样的几何形状和四杆靶之间的相位。其结果是,在欠热成像仪的MRT测量信息非常少非常有用。有许多替代方案,包括动态MRT(DMRT),最小温差感知(MTDP),三角方向鉴别(TOD),和客观MRT测试。所述NVESD方法是测量的MTF和系统噪声,并使用在MRT计算这些测量,得到良好的传感器性能的预测。本文介绍了问题MRT为欠成像,描述了替代的测量,并给出了NVESD方法MRT测量。

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