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The effect of temperature on the ferroelectric properties of Hafnium Zirconium Oxide MFM thin-film varactors

机译:温度对氧化铪氧化锆MFM薄膜变缩剂铁电性能的影响

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In this work, the tuning properties of hafnium zirconium oxide (HZO) metal-ferroelectric-metal (MFM) thin film varactors are investigated. It is shown that varactors with 1:1 Hf:Zr stoichiometry and 10 nm thickness, crystallized with rapid thermal annealing (RTA) at 400°C for 60 s, show a maximum capacitance tunability of 32% at room temperature without electric field pre-cycling. The cycling and accompanying wake-up effect lead to a reduction of tunability. Furthermore, the influence of the temperature on the ferroelectric properties and tunability is explored. Upon increase of measurement temperature to 200°C, the maximum tunability decreases to 24%. An elevated temperature leads to an increase in aniferroelectric-like (AFE) behavior, which is consistent with recent studies of ferroelastic nature of AFE switching.
机译:在这项工作中,研究了氧化铪(HZO)金属铁电金属(MFM)薄膜变容二氟铪的调谐性质。 结果显示,具有1:1 HF:ZR化学计量和10nm厚度的变缩剂,在400℃下在400℃下用快速热退火(RTA)结晶,在室温下显示出32%的最大电容可调性,没有电场预先 骑自行车。 循环和伴随的唤醒效果导致可调性的降低。 此外,探讨了温度对铁电性能和可调性的影响。 将测量温度的增加达到200°C时,最大可调性降低至24%。 升高的温度导致多氧化硅电气状(AFE)行为的增加,这与最近的AFE切换的枯叉弹性性质的研究一致。

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