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Current Noise up to GHz Band Generated by Slowly Breaking Silver-Compound Contacts with External DC Magnetic Field

机译:通过缓慢破坏与外部直流磁场的银色复合触点产生的GHz带的当前噪声

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摘要

Since electromagnetic (EM) noise resulting from an arc discharge disturbs other electric devices, parameters on electromagnetic compatibility, as well as lifetime and reliability, are important properties for electrical contacts. To clarify the characteristics and the mechanism of the generation of EM noise, the current noise up to GHz band generated by slowly breaking silver-compound contacts with external DC magnetic field, up to 40mT, is investigated experimentally in this paper. Firstly, effect of external DC magnetic field on the duration of the breaking arc is quantified. It was cleared that when the external magnetic field is applied, the duration of gaseous phase becomes shorter. Secondly, short time FFT for time change of frequency spectrum characteristics on current noise are studied by comparison with and without external DC magnetic field. It is measured that larger current noise arises, when the contact voltage is rapidly varied at the arc discharge. The variation of contact voltage in the "B=30Mt" case is higher than that of "without external DC magnetic field" case. These results suggest that although applying external DC magnetic field is effective in reduction of arc duration, higher variation of contact voltage in the gaseous phase which results in high frequency noise is caused. These results are basic and useful finding and consideration to clarify not only the correspondence to noise generation of the contact-breaking phenomena but the material dependency for EMC problems.
机译:由于电弧放电产生的电磁(EM)噪声使得其他电气设备产生其他电气设备,因此电磁兼容性以及寿命和可靠性产生的参数是电触点的重要性质。为了阐明EM噪声的产生的特性和机制,通过在本文中实验研究了通过缓慢破坏与外部直流磁场的银色化合物触点而产生的电流噪声,高达40mT。首先,量化外部直流磁场对断裂弧持续时间的影响。清楚地,当施加外部磁场时,气相持续时间变短。其次,通过与外部直流磁场进行比较,研究了电流噪声频谱特性的时间变化的短时间FFT。测量,当接触电压在电弧放电快速变化时,出现了更大的电流噪声。 “B = 30MT”壳体中的接触电压的变化高于“没有外部直流磁场”壳体的变化。这些结果表明,虽然施加外部直流磁场在降低电弧持续时间的情况下有效,但导致气相中的接触电压的变化越高,导致高频噪声。这些结果是基本的和有用的发现和考虑,以澄清与接触现象的噪声产生的对应关系,而是对EMC问题的材料依赖性。

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