The effect of positive polarization on grid growth, cell performance and life-'Willihnganz revisited-20 years' later'

摘要

Using ultrasonic reflection techniques to measure grid growth, carefully fabricated lead-acid telecommunication cells were tested at 160 degrees F over a wide range of positive polarizations (0-150 mV). It is shown that minimal plate growth occurs at 40 mV rather than at 70-80 mV, as previously reported. Plate growth at 100-150 mV is significantly more rapid than at 40 mV. Plate growth at 0 and 5 mV is not catastrophically rapid, and is significantly lower than at 150 mV. Plate growth at the traditionally 'forbidden region' of 20 mV is actually equivalent to growth at 80 mV, which has universally been considered the optimal float value. It is concluded that the present findings could significantly affect usage in modern telecommunication, utility, and UPS (uninterruptible power supply) installations.