首页> 外文会议>International Symposium on Devices, Circuits and Systems >On Defect Tolerance of Nanocrossbar Arrays using Divide and Conquer Technique
【24h】

On Defect Tolerance of Nanocrossbar Arrays using Divide and Conquer Technique

机译:用划分征服技术纳米杆阵列的缺陷公差

获取原文

摘要

The nanoscale designs usually face much higher defect rates as compared to the VLSI designs based on conventional lithography. New defect tolerant schemes are in required to achieve high yield at this scale. The crossbar-based architecture is one of the most promising nanoscale computational architectures. To understand various logic circuits using nanoscale crossbar arrays; these nano-crossbars containing crosspoints with defects can be utilised to map different logic functions. In this work, we use a novel technique for mapping different logic functions to respective rows of nano-crossbar arrays having defective crosspoints. The method proposed by us is to tolerate defects and make wise use of defective crossbar using divide and conquer technique. The experimental results show satisfactory performance of the proposed algorithm. Moreover, the proposed algorithm outperforms some earlier bio-inspired based mapping algorithms in terms of function mapping success percentage with the variation of defect percentage.
机译:与基于传统光刻的VLSI设计相比,纳米级设计通常面临更高的缺陷率。新的缺陷耐受计划是必需的,以实现此规模的高产。基于横杆的架构是最有前途的纳米级计算架构之一。使用纳米级横杆阵列理解各种逻辑电路;这些纳米横磁磁场含有具有缺陷的交叉点来映射不同的逻辑功能。在这项工作中,我们使用一种用于将不同的逻辑功能映射到具有有缺陷交叉点的纳米交叉阵列的各行的映射不同的逻辑功能。我们提出的方法是耐受缺陷,并通过除法和征服技术明智地使用缺陷的横杆。实验结果表明了所提出的算法的令人满意的性能。此外,所提出的算法在功能映射成功百分比方面优于一些早期的生物启发基于映射算法,其缺陷百分比的变化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号