One-carrier thermally stimulated currents and space-charge-limited currents in naphthalene crystals

摘要

It is well known that the measurement of space-charge-limited currents in solids is a powerful tool for detecting low density carriers traps. But measurement of thermally stimulated currents is also a good method for determining trapping parameters in dielectric materials. Each method has specific limitations, so it is interesting to carry out both techniques. We have used both SCLC and TSC to study naphthalene single crystals.