Multiple paths sensitization of digital oscillation built-in self test

摘要

Digital Oscillation Built-In Self Test (DOBIST) deals with testing path delay, gate delay and stuck-at faults in digital integrated circuits. This test methodology consists of sensitizing paths in the circuit under test so that they can oscillateas ring oscillators. While the 1st version of DOBIST is limited to single path sensitization, equations reported in this paper allow concurrent multiple paths sensitization. It results a simplification of the test generation procedure and a significantdecrease of the test time.