Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples

摘要

We present a new scheme of dispersive interferometry utilizing a femtosecond pulse laser for the dispersion-insensitive measurement of the refractive index of an optical material. Not only the group refractive index but also the variation of the phase refractive index with wavelength is determined without prior knowledge. Experiment results obtained from specimens of BK7 and UV silica are discussed.