Research on Reliability Optimization Model Construction of Embedded Electronic Information System

摘要

Aiming at the problem of inaccurate optimization in traditional reliability optimization methods, this research proposes a new reliability optimization method for embedded electronic information systems. Through analyzing the working principle of embedded electronic information system, the fault density function, failure rate, average life and availability of embedded electronic information system are optimized. This study establishes a model that restricts the reliability of embedded electronic information systems, so that the failure rate of embedded electronic information systems is reduced, the average life span is extended, and the reliability is significantly improved.