Can digital GaAs be used in a space environment? A look at singleevent upset in GaAs

摘要

The vulnerability to SEU (single event upset) of devices producedby standard GaAs processes is too great to allow their use in spaceapplications without some type of mitigation technique. GaAs foundriescan provide solutions for the short term by providing SEU hardeneddesigns incorporating redundancy for latches in standard cell familiesand gate arrays. As research progresses, techniques are expected to befound to reduce charge enhancement effects in GaAs FETs.Industry-developed solutions for sidegating and backgating effects mayalso improve SEU sensitivity. Designs intended for SEU environments canincorporate several mitigation techniques to provide satisfactoryoperation. However, hardening at the device may provide the bestperformance option