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Power integrity chip-package-PCB co-simulation for I/O interface of DDR3 high-speed memory

机译:DDR3高速存储器的I / O接口的电源完整性芯片封装-PCB协同仿真

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摘要

The modeling methodology of power distribution system (PDS) in three different levels, chip, package, and PCB for Input/Output (I/O) interface of DDR3 high-speed memory is established. The simulation results are verified with measurement results in frequency domain. Good agreement between them is clearly seen. The co-simulation with three kinds of PDS at the I/O interface and off-chip driver (OCD) circuits is constructed for time-domain simulation. The input impedance of three different PDSs is shown, and the simulation results for voltage variation and eye-patterns are compared with the corresponding input impedance. It is found lower input impedance have better power and signal integrity for the high-speed memory interface circuits. The PDS co-simulation of chip-package-PCB is important for the DDR3 circuit design.
机译:建立了用于DDR3高速存储器的输入/输出(I / O)接口的芯片,封装和PCB三种不同级别的配电系统(PDS)建模方法。仿真结果在频域中得到了测量结果的验证。可以清楚地看到它们之间的良好协议。构建了用于I / O接口的三种PDS和片外驱动器(OCD)电路的协同仿真,以进行时域仿真。显示了三种不同PDS的输入阻抗,并将电压变化和眼图的仿真结果与相应的输入阻抗进行了比较。发现较低的输入阻抗对于高速存储器接口电路具有更好的功率和信号完整性。芯片封装PCB的PDS协同仿真对于DDR3电路设计很重要。

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