首页> 外文会议>Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International >Lateral p-i-n photodetectors with 18 GHz bandwidth at 1.3 μmwavelength and small bias voltages
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Lateral p-i-n photodetectors with 18 GHz bandwidth at 1.3 μmwavelength and small bias voltages

机译:横向p-i-n光电探测器,带宽1.3 GHz,带宽18 GHz波长和小的偏置电压

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Simultaneous n-type and p-type diffusion, compositional mixing,and formation of ohmic contacts have been used in the fabrication oflateral p-i-n photodetectors for short (0.85 μm) and long (1.3 μmand 1.5 μm) wavelengths. Zinc-doped tungsten and MoGe2 areused for the p-type and n-type contacts, doping, and compositionalmixing using rapid thermal processing at ≃750° C. Withstructures utilizing GaAs and Ga0.47In0.53Asactive regions, 3 dB bandwidths exceeding 7.5 GHz and 18.0 GHz,respectively, have been achieved at bias voltages of ≃5 V. Thecorresponding dark currents are sub-100 pA and sub-10 nA and the devicesexhibit a large dynamic range, near-ideal responsivity, and a highsensitivity. The performance, ease of fabrication, and processcompatibility make these devices suitable for integration in digitalcircuits using FET
机译:同时进行n型和p型扩散,成分混合, 欧姆接触的形成和形成已被用于制造 短(0.85μm)和长(1.3μm)的侧向p-i-n光电探测器 和1.5μm)的波长。掺杂锌的钨和MoGe 2 用于p型和n型接触,掺杂和成分 在≃ 750°C下使用快速热处理进行混合 GaAs和Ga 0.47 In 0.53 As的结构 活动区域,超过7.5 GHz和18.0 GHz的3 dB带宽, 分别在≃ 5 V的偏置电压下已实现。 相应的暗电流分别为低于100 pA和低于10 nA,并且器件 表现出大的动态范围,接近理想的响应度和很高的 灵敏度。性能,易加工性和工艺 兼容性使这些设备适合集成在数字设备中 使用FET的电路

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