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Maximum packing density and minimum size of semiconductor devices

机译:最大封装密度和最小尺寸的半导体器件

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The absolute upper limit to packing density and the absolute minimum size of semiconductor devices, whether integrated or non-integrated, is investigated, It is found that absolute limitations exist based on physical phenomena, the mose important of which are statistical variations in impurity distribution, ultimate resolution of fabrication methods, power density and bombardment by cosmic rays. On the basis of these phenomena it is shown that for a medium size computer (105components), with a reasonable mean time between failures (1 month) the maximum packing density is approximately 1010components per cubic inch. This corresponds to a minimum size of the components which is within a factor of 2-5 of the dimensions of the active region of many devices of today. Therefore as far as the devices themselves are concerned the end of the road to smaller size has already been reached. A comparison of various components, and various forms of these components is given.
机译:研究了封装密度的绝对上限和半导体器件(无论是集成式还是非集成式)的绝对最小尺寸的绝对上限,发现存在基于物理现象的绝对极限,其中重要的是杂质分布的统计变化,制造方法,功率密度和宇宙射线轰击的最终解决方案。基于这些现象,表明对于中等大小的计算机(10个组件),平均故障间隔时间(1个月),最大包装密度约为10 10 每立方英寸的组件。这对应于组件的最小尺寸,该最小尺寸在当今许多设备的有源区域的尺寸的2-5倍之内。因此,就设备本身而言,已经达到了缩小尺寸的道路的尽头。给出了各种组件以及这些组件的各种形式的比较。

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