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Highly Manufacturable Low Power and High Performance 11LPP Platform Technology for Mobile and GPU Applications

机译:适用于移动和GPU应用的高度可制造的低功耗高性能11LPP平台技术

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摘要

11nm bulk FinFET process employing 3rd generation 14nm FEOL and 10nm BEOL process has been successfully demonstrated with updated design rules for optimal design kit support with 6.75T library. Compared to 14nm 1st generation FinFET, device performance has been improved by 25% in ring oscillator AC frequency at same Iddq or 42% power reduction is achieved. Adopting already mature 14nm and 10nm process technology, we can setup and demonstrate fast yield ramp.
机译:已经成功展示了采用第三代14nm FEOL和10nm BEOL工艺的11nm批量FinFET工艺以及更新的设计规则,可通过6.75T库实现最佳设计套件支持。与14nm的第一代FinFET相比,在相同的Iddq频率下,环形振荡器AC频率的器件性能提高了25%,或者功耗降低了42%。采用已经成熟的14nm和10nm工艺技术,我们可以设置并演示快速的成品率提升。

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