CMOS digital integrated circuits; ferroelectric devices; flip-flops; large scale integration; logic circuits; low-power electronics; random-access storage; CMOS; FE capacitors; NWF; PZT; capacitor size reduction; energy 2.4 pJ; ferroelectric-based nonvolatile flip-flop; leakage current; logic circuit; low-power LSL; nonvolatile storage capability; power consumption; power gating implementation; short-term data retention; size 130 nm; temperature 85 degC; thin films; time 1.6 mus; time 10 hour; time 10 year; time 170 ns; vital sensor; voltage 1.5 V; voltage 240 mV; word length 32 bit; CMOS integrated circuits; Capacitors; Flip-flops; Iron; Large scale integration; Logic circuits; Power supplies; Ferroelectric capacitor; Low power; Microporcessor; Non-volatile flip-flop; Non-volatile logic;
机译:具有10年数据保留能力的基于2.4 pJ铁电体的非易失性触发器
机译:基于新兴存储技术的非易失性触发器概述基于新兴存储技术的非易失性触发器概述
机译:基于MTJ的非易失性触发器和MRAM的图像数据的能量有效近似存储
机译:A 2.4 PJ铁电基非易失性触发器,具有10年的数据保留能力
机译:延迟触发器(DFF)的亚稳定性会影响时钟和数据恢复(CDR)以及锁相环(PLL)电路。
机译:具有低损伤CF4等离子处理的阻挡氧化物层的门注入金纳米颗粒非易失性存储器的数据保留特性
机译:具有低损伤CF4等离子体处理的阻挡氧化层的栅极注入金纳米粒子非易失性存储器的数据保持特性