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Benchmarking of Large-Area GaN-on-Si HFET Power Devices for Highly-Efficient, Fast-Switching Converter Applications

机译:适用于高效,快速开关转换器应用的大面积GaN-on-Si HFET功率器件基准测试

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This work reports the development and fabrication of large area AlGaN/GaN-on-Si HFETs for the use in highly-efficient fast-switching power converters. High performance is demonstrated by full characterization of static- and dynamic-parameters and a direct comparison to two commercial state-of-the-art silicon power devices. Compared to their silicon counterparts the GaN-device achieves by a factor of 3 lower static area specific on-state resistance RON×A, and by a factor of 3 lower static on-state resistance times gate charge product RON×Q. In switching tests the device achieves a low dynamic dispersion and low switching losses. Furthermore in this work a sophisticated measurement setup for characterization of dynamic parameters is developed and demonstrated. Characterization and test conditions are adapted for the use in fast-switching power converter applications.
机译:这项工作报告了用于高效快速开关电源转换器的大面积AlGaN / Si-GaN HFET的开发和制造。静态和动态参数的全面表征以及与两种商用最新型硅功率器件的直接比较证明了高性能。与氮化硅器件相比,GaN器件的静态面积比导通态电阻RON×A降低了3倍,静态导通态电阻乘以栅极电荷乘积RON×Q降低了3倍。在开关测试中,该器件实现了较低的动态色散和较低的开关损耗。此外,在这项工作中,还开发并演示了用于表征动态参数的复杂测量设置。表征和测试条件适合在快速开关电源转换器应用中使用。

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