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Optimization of FRA by an Improved Numerical Winding Model: Disk Space Variation

机译:通过改进的数值缠绕模型优化FRA:磁盘空间变化

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Frequency response analysis (FRA) is a well-established method used for condition assessment of transformer windings and has proven its sensitivity for detecting various mechanical and electrical faults. Although the FRA test procedures have been standardised, the interpretation of FRA results is still a challenge as it is limited to analysis of the experts in the field. Mainly, circuit models are proposed in the literature for supporting the interpretation of the transformer frequency response. However, these concentrated parameters models are limited to a certain frequency range, due to the difficulties in calculating parameters to build and solve a turn-to-turn model. Moreover, constant values for the parameters are employed in these models, while these parameters are frequency dependent. In contrast, this paper presents an improved numerical method to obtain a turn-based high frequency model of transformer windings. This model considers the frequency dependent effects of parameters. In the proposed model, FRA traces are directly derived from a high frequency finite element model (FEM) without employing the complex circuit model. For this purpose, a single-phase transformer is simulated using 3D FEM, which emulate the transformer and FRA measurement operations. First, the model is validated with measurements for healthy state of the windings. Afterwards, various levels of disk space variation (DSV) fault are implemented. This approach will facilitate the precise fault simulation and ease the objective interpretation of FRA.
机译:频率响应分析(FRA)是一种用于变压器绕组状态评估的公认方法,并已证明其对检测各种机械和电气故障的敏感性。尽管FRA测试程序已经标准化,但是FRA结果的解释仍然是一个挑战,因为它仅限于本领域专家的分析。主要地,在文献中提出了电路模型以支持对变压器频率响应的解释。然而,由于难以计算参数以建立和求解匝间模型,因此这些集中的参数模型被限制在一定的频率范围内。此外,在这些模型中采用参数的恒定值,而这些参数与频率有关。相比之下,本文提出了一种改进的数值方法来获得基于匝数的变压器绕组高频模型。该模型考虑了参数的频率依赖性影响。在提出的模型中,FRA迹线是直接从高频有限元模型(FEM)导出的,而无需采用复杂的电路模型。为此,使用3D FEM对单相变压器进行仿真,以模拟变压器和FRA测量操作。首先,通过测量绕组的健康状态来验证模型。此后,将实现各种级别的磁盘空间变化(DSV)故障。这种方法将有助于精确的故障仿真并简化FRA的客观解释。

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