Test and testability techniques for open defects in RAM addressdecoders

摘要

It is a prevalent assumption that all RAM address decoder defectscan be modelled as RAM array faults influencing one or more RAM cells.Therefore, can be implicitly detected by testing the RAM matrix with themarch tests. Recently, we came across some failures in embedded SRAMswhich were not detected by the march tests. The carried out analysisdemonstrated the presence of open defects in address decoders thatcannot be modelled as the conventional coupling faults, therefore, arenot detected by the march tests. In this article, we present the testand testability strategies for such hard-to-detect open defects