MAPPING OF STRONTIUM DISTRIBUTION IN PLAGIOCLASES USING WDS ON SEM

摘要

Microanalysis by means of scanning electron microscopes (SEM) is widespread in materials relatedsciences including geosciences. Due to its versatility, robustness and speed energy-dispersiveX-ray spectrometry (EDS) is thereby widely-used and appropriate for the majority of analyticalapplications. For more demanding tasks however, requiring higher spectral resolution and traceelement detection capabilities beyond the limits of EDS, wavelength-dispersive X-rayspectrometry (WDS) is the ideal technique for gaining even more precise data duringmicroanalysis. Well defined, isolated elemental peaks in WDS spectra can easily be identified andquantified, where the limited spectral resolution of energy-dispersive spectrometry frequently leadsto extensive peak overlaps causing serious analytical challenges. These challenges are exacerbatedby distinct concentration differences between the elements with overlapping X-ray peaks.