Proceedings Seventh Asian Test Symposium (ATS'98) (Cat.No.98TB100259)

摘要

The following topics were dealt with. BIST; high level synthesis;delay testing; fault modelling; software testing; current testing;sequential testing; boundary scan testing; interconnect testing; FPGAtesting; fault tolerance; IDDQ testing; memory testing; mixed signaltesting; design verification; and ATPG